<HashMap><database>biostudies-literature</database><scores/><additional><submitter>Raffaelle PR</submitter><funding>Sandia National Laboratories</funding><funding>Division of Civil, Mechanical and Manufacturing Innovation</funding><pagination>55139-55149</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC10694808</full_dataset_link><repository>biostudies-literature</repository><omics_type>Unknown</omics_type><volume>15(47)</volume><pubmed_abstract>The focus of this study was to demonstrate the vapor-phase halogenation of Si(100) and subsequently evaluate the inhibiting ability of the halogenated surfaces toward atomic layer deposition (ALD) of aluminum oxide (Al&lt;sub>2&lt;/sub>O&lt;sub>3&lt;/sub>). Hydrogen-terminated silicon ⟨100⟩ (H-Si(100)) was halogenated using &lt;i>N&lt;/i>-chlorosuccinimide (&lt;i>N&lt;/i>CS), &lt;i>N&lt;/i>-bromosuccinimide (NBS), and &lt;i>N&lt;/i>-iodosuccinimide (NIS) in a vacuum-based chemical process. The composition and physical properties of the prepared monolayers were analyzed by using X-ray photoelectron spectroscopy (XPS) and contact angle (CA) goniometry. These measurements confirmed that all three reagents were more effective in halogenating H-Si(100) over OH-Si(100) in the vapor phase. The stability of the modified surfaces in air was also tested, with the chlorinated surface showing the greatest resistance to monolayer degradation and silicon oxide (SiO&lt;sub>2&lt;/sub>) generation within the first 24 h of exposure to air. XPS and atomic force microscopy (AFM) measurements showed that the succinimide-derived Hal-Si(100) surfaces exhibited blocking ability superior to that of H-Si(100), a commonly used ALD resist. This halogenation method provides a dry chemistry alternative for creating halogen-based ALD resists on Si(100) in near-ambient environments.</pubmed_abstract><journal>ACS applied materials &amp; interfaces</journal><pubmed_title>Vapor-Phase Halogenation of Hydrogen-Terminated Silicon(100) Using &lt;i>N&lt;/i>-Halogen-succinimides.</pubmed_title><pmcid>PMC10694808</pmcid><funding_grant_id>2225896</funding_grant_id><funding_grant_id>DE-NA-0003525</funding_grant_id><pubmed_authors>Raffaelle PR</pubmed_authors><pubmed_authors>Shestopalov AA</pubmed_authors><pubmed_authors>Wang GT</pubmed_authors></additional><is_claimable>false</is_claimable><name>Vapor-Phase Halogenation of Hydrogen-Terminated Silicon(100) Using &lt;i>N&lt;/i>-Halogen-succinimides.</name><description>The focus of this study was to demonstrate the vapor-phase halogenation of Si(100) and subsequently evaluate the inhibiting ability of the halogenated surfaces toward atomic layer deposition (ALD) of aluminum oxide (Al&lt;sub>2&lt;/sub>O&lt;sub>3&lt;/sub>). Hydrogen-terminated silicon ⟨100⟩ (H-Si(100)) was halogenated using &lt;i>N&lt;/i>-chlorosuccinimide (&lt;i>N&lt;/i>CS), &lt;i>N&lt;/i>-bromosuccinimide (NBS), and &lt;i>N&lt;/i>-iodosuccinimide (NIS) in a vacuum-based chemical process. The composition and physical properties of the prepared monolayers were analyzed by using X-ray photoelectron spectroscopy (XPS) and contact angle (CA) goniometry. These measurements confirmed that all three reagents were more effective in halogenating H-Si(100) over OH-Si(100) in the vapor phase. The stability of the modified surfaces in air was also tested, with the chlorinated surface showing the greatest resistance to monolayer degradation and silicon oxide (SiO&lt;sub>2&lt;/sub>) generation within the first 24 h of exposure to air. XPS and atomic force microscopy (AFM) measurements showed that the succinimide-derived Hal-Si(100) surfaces exhibited blocking ability superior to that of H-Si(100), a commonly used ALD resist. This halogenation method provides a dry chemistry alternative for creating halogen-based ALD resists on Si(100) in near-ambient environments.</description><dates><release>2023-01-01T00:00:00Z</release><publication>2023 Nov</publication><modification>2026-06-03T08:06:26.976Z</modification><creation>2026-04-26T03:11:21.703Z</creation></dates><accession>S-EPMC10694808</accession><cross_references><pubmed>37965814</pubmed><doi>10.1021/acsami.3c13269</doi></cross_references></HashMap>