{"database":"biostudies-literature","file_versions":[],"scores":null,"additional":{"submitter":["Park J"],"funding":["National Research Foundation of Korea (NRF)","National Research Foundation of Korea","Welch Foundation"],"pagination":["2138"],"full_dataset_link":["https://www.ebi.ac.uk/biostudies/studies/S-EPMC10924103"],"repository":["biostudies-literature"],"omics_type":["Unknown"],"volume":["15(1)"],"pubmed_abstract":["The advanced patterning process is the basis of integration technology to realize the development of next-generation high-speed, low-power consumption devices. Recently, area-selective atomic layer deposition (AS-ALD), which allows the direct deposition of target materials on the desired area using a deposition barrier, has emerged as an alternative patterning process. However, the AS-ALD process remains challenging to use for the improvement of patterning resolution and selectivity. In this study, we report a superlattice-based AS-ALD (SAS-ALD) process using a two-dimensional (2D) MoS<sub>2</sub>-MoSe<sub>2</sub> lateral superlattice as a pre-defining template. We achieved a minimum half pitch size of a sub-10 nm scale for the resulting AS-ALD on the 2D superlattice template by controlling the duration time of chemical vapor deposition (CVD) precursors. SAS-ALD introduces a mechanism that enables selectivity through the adsorption and diffusion processes of ALD precursors, distinctly different from conventional AS-ALD method. This technique facilitates selective deposition even on small pattern sizes and is compatible with the use of highly reactive precursors like trimethyl aluminum. Moreover, it allows for the selective deposition of a variety of materials, including Al<sub>2</sub>O<sub>3</sub>, HfO<sub>2</sub>, Ru, Te, and Sb<sub>2</sub>Se<sub>3</sub>."],"journal":["Nature communications"],"pubmed_title":["Area-selective atomic layer deposition on 2D monolayer lateral superlattices."],"pmcid":["PMC10924103"],"funding_grant_id":["C-2065-20210327","2020R1C1C1011219","2020M3D1A1110659","2022M3H4A1A01010325","2022M3H4A1A01013228"],"pubmed_authors":["Kim C","Lee J","Oh S","Han Y","Kwak SJ","Lee WB","Oh SH","Chai HJ","Eom T","Suh J","Kang M","Kang K","Yang H","Park H","Kwon S","Kang W","Park J","Kim TS","Kang S","Chung TM","Shin B","Noh G","Moon E","Shi C","Kwak JY","Jeong HY","Kim Y","Lee Y","Hur N","Lou J"],"additional_accession":[]},"is_claimable":false,"name":"Area-selective atomic layer deposition on 2D monolayer lateral superlattices.","description":"The advanced patterning process is the basis of integration technology to realize the development of next-generation high-speed, low-power consumption devices. Recently, area-selective atomic layer deposition (AS-ALD), which allows the direct deposition of target materials on the desired area using a deposition barrier, has emerged as an alternative patterning process. However, the AS-ALD process remains challenging to use for the improvement of patterning resolution and selectivity. In this study, we report a superlattice-based AS-ALD (SAS-ALD) process using a two-dimensional (2D) MoS<sub>2</sub>-MoSe<sub>2</sub> lateral superlattice as a pre-defining template. We achieved a minimum half pitch size of a sub-10 nm scale for the resulting AS-ALD on the 2D superlattice template by controlling the duration time of chemical vapor deposition (CVD) precursors. SAS-ALD introduces a mechanism that enables selectivity through the adsorption and diffusion processes of ALD precursors, distinctly different from conventional AS-ALD method. This technique facilitates selective deposition even on small pattern sizes and is compatible with the use of highly reactive precursors like trimethyl aluminum. Moreover, it allows for the selective deposition of a variety of materials, including Al<sub>2</sub>O<sub>3</sub>, HfO<sub>2</sub>, Ru, Te, and Sb<sub>2</sub>Se<sub>3</sub>.","dates":{"release":"2024-01-01T00:00:00Z","publication":"2024 Mar","modification":"2026-06-23T03:17:05.06Z","creation":"2025-04-05T19:49:18.991Z"},"accession":"S-EPMC10924103","cross_references":{"pubmed":["38459015"],"doi":["10.1038/s41467-024-46293-w"]}}