<HashMap><database>biostudies-literature</database><scores/><additional><submitter>Zhang Z</submitter><funding>Natural Science Foundation of Beijing Municipality (Beijing Natural Science Foundation)</funding><funding>National Natural Science Foundation of China (National Science Foundation of China)</funding><pagination>10436</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC11608312</full_dataset_link><repository>biostudies-literature</repository><omics_type>Unknown</omics_type><volume>15(1)</volume><pubmed_abstract>Group-III nitride semiconductors such as GaN have various important applications based on their three-dimensional form. Previous work has demonstrated the realization of buckled two-dimensional GaN, which can be used in GaN-based nanodevices. However, the understanding of buckled two-dimensional GaN remains limited due to the difficulties in experimental characterization. Here, for the first time, we have experimentally determined the phonon dispersion of buckled two-dimensional GaN by using monochromatic electron energy loss spectroscopy in conjunction with scanning transmission electron microscopy. A phonon band gap of ~40 meV between the acoustic and optical phonon branches is identified for buckled two-dimensional GaN. This phonon band gap is significantly larger than that of ~20 meV f</pubmed_abstract><journal>Nature communications</journal><pubmed_title>Phonon dispersion of buckled two-dimensional GaN.</pubmed_title><pmcid>PMC11608312</pmcid><funding_grant_id>No. 62104010</funding_grant_id><funding_grant_id>No. 62374010</funding_grant_id><funding_grant_id>No. Z200004</funding_grant_id><pubmed_authors>Jiang H</pubmed_authors><pubmed_authors>Shen B</pubmed_authors><pubmed_authors>Wang J</pubmed_authors><pubmed_authors>Wang P</pubmed_authors><pubmed_authors>Gao P</pubmed_authors><pubmed_authors>Zhang Z</pubmed_authors><pubmed_authors>Zhang Y</pubmed_authors><pubmed_authors>Wang T</pubmed_authors><pubmed_authors>Wang X</pubmed_authors><pubmed_authors>Xu X</pubmed_authors><pubmed_authors>Wang Z</pubmed_authors><pubmed_authors>Liu F</pubmed_authors><pubmed_authors>Yu Y</pubmed_authors></additional><is_claimable>false</is_claimable><name>Phonon dispersion of buckled two-dimensional GaN.</name><description>Group-III nitride semiconductors such as GaN have various important applications based on their three-dimensional form. Previous work has demonstrated the realization of buckled two-dimensional GaN, which can be used in GaN-based nanodevices. However, the understanding of buckled two-dimensional GaN remains limited due to the difficulties in experimental characterization. Here, for the first time, we have experimentally determined the phonon dispersion of buckled two-dimensional GaN by using monochromatic electron energy loss spectroscopy in conjunction with scanning transmission electron microscopy. A phonon band gap of ~40 meV between the acoustic and optical phonon branches is identified for buckled two-dimensional GaN. This phonon band gap is significantly larger than that of ~20 meV f</description><dates><release>2024-01-01T00:00:00Z</release><publication>2024 Nov</publication><modification>2025-04-04T00:21:47.226Z</modification><creation>2025-04-04T00:21:47.226Z</creation></dates><accession>S-EPMC11608312</accession><cross_references><pubmed>39616154</pubmed><doi>10.1038/s41467-024-54921-8</doi></cross_references></HashMap>