<HashMap><database>biostudies-literature</database><scores/><additional><omics_type>Unknown</omics_type><volume>15(1)</volume><submitter>Astrand M</submitter><pubmed_abstract>X-ray ptychography provides the highest resolution non-destructive imaging at synchrotron radiation facilities, and the efficiency of this method is crucial for coping with limited experimental time. Recent advancements in multi-beam ptychography have enabled larger fields of view, but spatial resolution for large 3D samples remains constrained by their thickness, requiring consideration of multiple scattering events. Although this challenge has been addressed using multi-slicing in conventional ptychography, the integration of multi-slicing with multi-beam ptychography has not yet been explored. Here we present the first successful combination of these two methods, enabling high-resolution imaging of nanofeatures at depths comparable to the lateral dimensions that can be addressed by stat</pubmed_abstract><journal>Scientific reports</journal><pagination>9273</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC11920106</full_dataset_link><repository>biostudies-literature</repository><pubmed_title>Multi-beam multi-slice X-ray ptychography.</pubmed_title><pmcid>PMC11920106</pmcid><pubmed_authors>Kahnt M</pubmed_authors><pubmed_authors>Villanueva Perez P</pubmed_authors><pubmed_authors>Lyubomirskiy M</pubmed_authors><pubmed_authors>Li T</pubmed_authors><pubmed_authors>Vogt U</pubmed_authors><pubmed_authors>Astrand M</pubmed_authors><pubmed_authors>Yang R</pubmed_authors></additional><is_claimable>false</is_claimable><name>Multi-beam multi-slice X-ray ptychography.</name><description>X-ray ptychography provides the highest resolution non-destructive imaging at synchrotron radiation facilities, and the efficiency of this method is crucial for coping with limited experimental time. Recent advancements in multi-beam ptychography have enabled larger fields of view, but spatial resolution for large 3D samples remains constrained by their thickness, requiring consideration of multiple scattering events. Although this challenge has been addressed using multi-slicing in conventional ptychography, the integration of multi-slicing with multi-beam ptychography has not yet been explored. Here we present the first successful combination of these two methods, enabling high-resolution imaging of nanofeatures at depths comparable to the lateral dimensions that can be addressed by stat</description><dates><release>2025-01-01T00:00:00Z</release><publication>2025 Mar</publication><modification>2025-04-26T05:46:04.865Z</modification><creation>2025-04-06T11:40:21.588Z</creation></dates><accession>S-EPMC11920106</accession><cross_references><pubmed>40102622</pubmed><doi>10.1038/s41598-025-93757-0</doi></cross_references></HashMap>