<HashMap><database>biostudies-literature</database><scores/><additional><submitter>Wang MW</submitter><funding>Fundo para o Desenvolvimento das Ci?ncias e da Tecnologia</funding><funding>Universidade de Macau</funding><pagination>9242-9248</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC12434719</full_dataset_link><repository>biostudies-literature</repository><omics_type>Unknown</omics_type><volume>16(36)</volume><pubmed_abstract>High-quality hole injection layers (HILs) are essential for efficient and stable quantum dot light-emitting diodes (QLEDs). While NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub> is a stable alternative to the poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) HIL, its low hole injection limits its practical application. This work enhances NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub> hole injection efficiency by combining Mg alloying to deepen work function (5.49 eV vs 5.20 eV) with O&lt;sub>3&lt;/sub> treatment to boost conductivity while suppressing traps. Using sol-gel synthesized Mg-alloyed NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub> nanoparticles followed by O&lt;sub>3&lt;/sub> treatment via atomic layer deposition, the resulting QLEDs achieve peak efficiencies of 17.85 cd A&lt;sup>-1&lt;/sup> and 11.23 lm W&lt;sup>-1&lt;/sup>, representing 54% and 171% improvements over NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub>-based QLEDs (11.56 cd A&lt;sup>-1&lt;/sup>, 4.15 lm W&lt;sup>-1&lt;/sup>). Operational stability significantly improves, with a &lt;i>T&lt;/i>&lt;sub>50&lt;/sub> lifetime of 272 h (&lt;i>L&lt;/i>&lt;sub>0&lt;/sub> = 1000 cd m&lt;sup>-2&lt;/sup>), over 2.2-fold that of NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub>-based QLEDs (84 h). This methodology provides a viable pathway to develop a NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub> HIL for advancing stable and high-efficiency QLEDs.</pubmed_abstract><journal>The journal of physical chemistry letters</journal><pubmed_title>Mg-Incorporated Nickel Oxide Hole Injection Layer for Stable and Efficient Quantum Dot Light-Emitting Diodes.</pubmed_title><pmcid>PMC12434719</pmcid><funding_grant_id>0038/2019/A1</funding_grant_id><funding_grant_id>0107/2023/AFJ</funding_grant_id><funding_grant_id>0083/2023/ITP2</funding_grant_id><funding_grant_id>0027/2023/AMJ</funding_grant_id><funding_grant_id>MYRG2020-00082-IAPME</funding_grant_id><funding_grant_id>MYRG-GRG2023-00230-IAPME-UMDF</funding_grant_id><funding_grant_id>199/2017/A3</funding_grant_id><pubmed_authors>Liu H</pubmed_authors><pubmed_authors>Jiang J</pubmed_authors><pubmed_authors>Song YM</pubmed_authors><pubmed_authors>Wang MW</pubmed_authors><pubmed_authors>Ding T</pubmed_authors><pubmed_authors>Gao PL</pubmed_authors><pubmed_authors>Ng KW</pubmed_authors><pubmed_authors>Wang SP</pubmed_authors></additional><is_claimable>false</is_claimable><name>Mg-Incorporated Nickel Oxide Hole Injection Layer for Stable and Efficient Quantum Dot Light-Emitting Diodes.</name><description>High-quality hole injection layers (HILs) are essential for efficient and stable quantum dot light-emitting diodes (QLEDs). While NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub> is a stable alternative to the poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) HIL, its low hole injection limits its practical application. This work enhances NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub> hole injection efficiency by combining Mg alloying to deepen work function (5.49 eV vs 5.20 eV) with O&lt;sub>3&lt;/sub> treatment to boost conductivity while suppressing traps. Using sol-gel synthesized Mg-alloyed NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub> nanoparticles followed by O&lt;sub>3&lt;/sub> treatment via atomic layer deposition, the resulting QLEDs achieve peak efficiencies of 17.85 cd A&lt;sup>-1&lt;/sup> and 11.23 lm W&lt;sup>-1&lt;/sup>, representing 54% and 171% improvements over NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub>-based QLEDs (11.56 cd A&lt;sup>-1&lt;/sup>, 4.15 lm W&lt;sup>-1&lt;/sup>). Operational stability significantly improves, with a &lt;i>T&lt;/i>&lt;sub>50&lt;/sub> lifetime of 272 h (&lt;i>L&lt;/i>&lt;sub>0&lt;/sub> = 1000 cd m&lt;sup>-2&lt;/sup>), over 2.2-fold that of NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub>-based QLEDs (84 h). This methodology provides a viable pathway to develop a NiO&lt;sub>&lt;i>x&lt;/i>&lt;/sub> HIL for advancing stable and high-efficiency QLEDs.</description><dates><release>2025-01-01T00:00:00Z</release><publication>2025 Sep</publication><modification>2026-06-01T15:47:19.908Z</modification><creation>2026-04-08T13:50:52.304Z</creation></dates><accession>S-EPMC12434719</accession><cross_references><pubmed>40877751</pubmed><doi>10.1021/acs.jpclett.5c02298</doi></cross_references></HashMap>