<HashMap><database>biostudies-literature</database><scores/><additional><omics_type>Unknown</omics_type><volume>6</volume><submitter>Yu S</submitter><pubmed_abstract>In order to improve the conductivity of the single-layered nano-thick F doped SnO2 (FTO) thin films, an Ag mid-layer is embedded between the FTO layers. In our work, the effects of mid-layer Ag and top FTO layer on the structural, electrical and optical properties of FTO/Ag/FTO multilayered composite structures deposited on quartz glass substrates by magnetron sputtering at 100 °C have been investigated. As the thickness of Ag mid-layer increases, the resistivity decreases. As the top FTO layer thickness increases, the resistivity increases. The highest value of figure of merit φTC is 7.8 × 10(-2 ) Ω(-1) for the FTO (20 nm)/Ag (7 nm)/FTO (30 nm) multilayers, while the average optical transmittance is 95.5% in the visible range of wavelengths and the resistivity is 8.8 × 10(-5 ) Ω·cm. In addition, we also describe the influence of Ag and top FTO layer thickness on structural, electrical and optical properties of the nano-thick FTO (20 nm)/Ag/FTO multilayers and the mechanism of the changes of electrical and optical properties at different Ag and top FTO layer thicknesses.</pubmed_abstract><journal>Scientific reports</journal><pagination>20399</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC4735849</full_dataset_link><repository>biostudies-literature</repository><pubmed_title>Preparation and investigation of nano-thick FTO/Ag/FTO multilayer transparent electrodes with high figure of merit.</pubmed_title><pmcid>PMC4735849</pmcid><pubmed_authors>Zhang W</pubmed_authors><pubmed_authors>Yu S</pubmed_authors><pubmed_authors>Lyu X</pubmed_authors><pubmed_authors>Li L</pubmed_authors></additional><is_claimable>false</is_claimable><name>Preparation and investigation of nano-thick FTO/Ag/FTO multilayer transparent electrodes with high figure of merit.</name><description>In order to improve the conductivity of the single-layered nano-thick F doped SnO2 (FTO) thin films, an Ag mid-layer is embedded between the FTO layers. In our work, the effects of mid-layer Ag and top FTO layer on the structural, electrical and optical properties of FTO/Ag/FTO multilayered composite structures deposited on quartz glass substrates by magnetron sputtering at 100 °C have been investigated. As the thickness of Ag mid-layer increases, the resistivity decreases. As the top FTO layer thickness increases, the resistivity increases. The highest value of figure of merit φTC is 7.8 × 10(-2 ) Ω(-1) for the FTO (20 nm)/Ag (7 nm)/FTO (30 nm) multilayers, while the average optical transmittance is 95.5% in the visible range of wavelengths and the resistivity is 8.8 × 10(-5 ) Ω·cm. In addition, we also describe the influence of Ag and top FTO layer thickness on structural, electrical and optical properties of the nano-thick FTO (20 nm)/Ag/FTO multilayers and the mechanism of the changes of electrical and optical properties at different Ag and top FTO layer thicknesses.</description><dates><release>2016-01-01T00:00:00Z</release><publication>2016 Feb</publication><modification>2026-05-05T09:04:13.093Z</modification><creation>2019-03-27T02:08:02Z</creation></dates><accession>S-EPMC4735849</accession><cross_references><pubmed>26833398</pubmed><doi>10.1038/srep20399</doi></cross_references></HashMap>