{"database":"biostudies-literature","file_versions":[],"scores":null,"additional":{"omics_type":["Unknown"],"volume":["8"],"submitter":["Labidi H"],"pubmed_abstract":["The origin of bond-resolved atomic force microscope images remains controversial. Moreover, most work to date has involved planar, conjugated hydrocarbon molecules on a metal substrate thereby limiting knowledge of the generality of findings made about the imaging mechanism. Here we report the study of a very different sample; a hydrogen-terminated silicon surface. A procedure to obtain a passivated hydrogen-functionalized tip is defined and evolution of atomic force microscopy images at different tip elevations are shown. At relatively large tip-sample distances, the topmost atoms appear as distinct protrusions. However, on decreasing the tip-sample distance, features consistent with the silicon covalent bonds of the surface emerge. Using a density functional tight-binding-based method to simulate atomic force microscopy images, we reproduce the experimental results. The role of the tip flexibility and the nature of bonds and false bond-like features are discussed."],"journal":["Nature communications"],"pagination":["14222"],"full_dataset_link":["https://www.ebi.ac.uk/biostudies/studies/S-EPMC5316802"],"repository":["biostudies-literature"],"pubmed_title":["Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface."],"pmcid":["PMC5316802"],"pubmed_authors":["Koleini M","Pitters J","Cloutier M","Salomons M","Huff T","Labidi H","Wolkow RA"],"additional_accession":[]},"is_claimable":false,"name":"Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface.","description":"The origin of bond-resolved atomic force microscope images remains controversial. Moreover, most work to date has involved planar, conjugated hydrocarbon molecules on a metal substrate thereby limiting knowledge of the generality of findings made about the imaging mechanism. Here we report the study of a very different sample; a hydrogen-terminated silicon surface. A procedure to obtain a passivated hydrogen-functionalized tip is defined and evolution of atomic force microscopy images at different tip elevations are shown. At relatively large tip-sample distances, the topmost atoms appear as distinct protrusions. However, on decreasing the tip-sample distance, features consistent with the silicon covalent bonds of the surface emerge. Using a density functional tight-binding-based method to simulate atomic force microscopy images, we reproduce the experimental results. The role of the tip flexibility and the nature of bonds and false bond-like features are discussed.","dates":{"release":"2017-01-01T00:00:00Z","publication":"2017 Feb","modification":"2024-10-17T16:39:03.428Z","creation":"2019-03-27T02:36:52Z"},"accession":"S-EPMC5316802","cross_references":{"pubmed":["28194036"],"doi":["10.1038/ncomms14222"]}}