{"database":"biostudies-literature","file_versions":[],"scores":{"citationCount":0,"reanalysisCount":0,"viewCount":117,"searchCount":0},"additional":{"submitter":["Dong B"],"funding":["MOE International Laboratory for Optical Information Technologies and the 111 Project.National Key Research and Development Program of China","Guangdong Provincial Key Laboratory of Optical Information Materials and Technology","Science and Technology Program of Guangzhou","Science and Technology Project of Shenzhen Municipal Science and Technology Innovation Committee","Program for Chang Jiang Scholars and Innovative Research Teams in Universities","Guangzhou Key Laboratory of Electronic Paper Displays Materials and Devices","Science and technology project of Guangdong Province","Guangdong Innovative Research Team Program"],"pagination":["181121"],"full_dataset_link":["https://www.ebi.ac.uk/biostudies/studies/S-EPMC6281906"],"repository":["biostudies-literature"],"omics_type":["Unknown"],"volume":["5(11)"],"pubmed_abstract":["Dielectric failure as well as optical switching failure in electrofluidic display (EFD) are still a bottleneck for sufficient device lifetime. In this study, a dielectric redundancy-designed multilayer insulator of ParyleneC/AF1600X was applied in an EFD device. The reliability performance was systematically studied by tracking the applied voltage-dependent leakage current and capacitance changes (I-V and C-V curves) with thermal ageing time. The multilayer insulator shows a more stable performance in leakage current compared to a single-layer insulator. The failure modes during operation underlying the single-layer and the multilayer dielectric appear to be different as exemplified by microscopic images. The single-layer AFX shows significant detachment. In addition, by quantitatively analysing the C-V curves with ageing time, we find that for the single AFX device, the dominant failure mode is 'no-opening' of the pixels. For the multilayer device, the dominant failure mode is 'no-closing' of the pixels. This study provides tools for distinguishing the basic failure modes of an EFD device and demonstrates a quantitative method for evaluating the reliability performance of the device under thermal ageing."],"journal":["Royal Society open science"],"pubmed_title":["Failure modes analysis of electrofluidic display under thermal ageing."],"pmcid":["PMC6281906"],"funding_grant_id":["No. IRT_17R40","No.2016YFB0401502","No. 201607010203","Grant No. 2017B030301007","No. 2016A010101023, 2016B090918083","201705030007","GQYCZZ20150721150406","No. 2011D039"],"pubmed_authors":["Li H","Zhou R","Henzen AV","Groenewold J","Tang B","Zhou G","Dong B"],"view_count":["117"],"additional_accession":[]},"is_claimable":false,"name":"Failure modes analysis of electrofluidic display under thermal ageing.","description":"Dielectric failure as well as optical switching failure in electrofluidic display (EFD) are still a bottleneck for sufficient device lifetime. In this study, a dielectric redundancy-designed multilayer insulator of ParyleneC/AF1600X was applied in an EFD device. The reliability performance was systematically studied by tracking the applied voltage-dependent leakage current and capacitance changes (I-V and C-V curves) with thermal ageing time. The multilayer insulator shows a more stable performance in leakage current compared to a single-layer insulator. The failure modes during operation underlying the single-layer and the multilayer dielectric appear to be different as exemplified by microscopic images. The single-layer AFX shows significant detachment. In addition, by quantitatively analysing the C-V curves with ageing time, we find that for the single AFX device, the dominant failure mode is 'no-opening' of the pixels. For the multilayer device, the dominant failure mode is 'no-closing' of the pixels. This study provides tools for distinguishing the basic failure modes of an EFD device and demonstrates a quantitative method for evaluating the reliability performance of the device under thermal ageing.","dates":{"release":"2018-01-01T00:00:00Z","publication":"2018 Nov","modification":"2024-11-12T00:35:31.634Z","creation":"2019-03-27T00:13:08Z"},"accession":"S-EPMC6281906","cross_references":{"pubmed":["30564404"],"doi":["10.1098/rsos.181121"]}}