<HashMap><database>biostudies-literature</database><scores><citationCount>0</citationCount><reanalysisCount>0</reanalysisCount><viewCount>44</viewCount><searchCount>0</searchCount></scores><additional><submitter>Bertolini G</submitter><funding>Swiss National Science Foundation</funding><funding>Kommission für Technologie und Innovation</funding><funding>European Commission</funding><pagination>210511</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC8278050</full_dataset_link><repository>biostudies-literature</repository><omics_type>Unknown</omics_type><volume>8(7)</volume><pubmed_abstract>In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin &lt;i>et al.&lt;/i> 2016 &lt;i>Proc. R. Soc. A&lt;/i> &lt;b>472&lt;/b>, 20160475. (doi:10.1098/rspa.2016.0475)), the field-emitted current was found to change by approximately 1% at a monatomic surface step (approx. 200 pm thick). Here we prepare surface domains of adjacent different materials that, in some instances, have a topographic contrast smaller than 15 pm. Nevertheless, we observe a contrast in the field-emitted current as high as 10%. This non-topographic collector material dependence is a yet unexplored degree of freedom calling for a new understanding of the quantum mechanical tunnelling barrier at the source site that takes into account the properties of the material at the collector site.</pubmed_abstract><journal>Royal Society open science</journal><pubmed_title>Non-topographic current contrast in scanning field emission microscopy.</pubmed_title><pmcid>PMC8278050</pmcid><funding_grant_id>20-134422</funding_grant_id><funding_grant_id>134422</funding_grant_id><funding_grant_id>9860.1 PFNM-NM</funding_grant_id><funding_grant_id>606988 (FP7-PEOPLE-2013-ITN)</funding_grant_id><pubmed_authors>Bertolini G</pubmed_authors><pubmed_authors>Zanin DA</pubmed_authors><pubmed_authors>Cabrera H</pubmed_authors><pubmed_authors>Pescia D</pubmed_authors><pubmed_authors>Gurlu O</pubmed_authors><pubmed_authors>Schnedler M</pubmed_authors><pubmed_authors>Xanthakis JP</pubmed_authors><pubmed_authors>Dunin-Borkowski RE</pubmed_authors><pubmed_authors>Probsting R</pubmed_authors><pubmed_authors>Wei J</pubmed_authors><pubmed_authors>Westholm D</pubmed_authors><pubmed_authors>Ramsperger U</pubmed_authors><view_count>44</view_count></additional><is_claimable>false</is_claimable><name>Non-topographic current contrast in scanning field emission microscopy.</name><description>In scanning field emission microscopy (SFEM), a tip (the source) is approached to few (or a few tens of) nanometres distance from a surface (the collector) and biased to field-emit electrons. In a previous study (Zanin &lt;i>et al.&lt;/i> 2016 &lt;i>Proc. R. Soc. A&lt;/i> &lt;b>472&lt;/b>, 20160475. (doi:10.1098/rspa.2016.0475)), the field-emitted current was found to change by approximately 1% at a monatomic surface step (approx. 200 pm thick). Here we prepare surface domains of adjacent different materials that, in some instances, have a topographic contrast smaller than 15 pm. Nevertheless, we observe a contrast in the field-emitted current as high as 10%. This non-topographic collector material dependence is a yet unexplored degree of freedom calling for a new understanding of the quantum mechanical tunnelling barrier at the source site that takes into account the properties of the material at the collector site.</description><dates><release>2021-01-01T00:00:00Z</release><publication>2021 Jul</publication><modification>2024-02-15T20:07:16.882Z</modification><creation>2022-02-10T22:12:57.064Z</creation></dates><accession>S-EPMC8278050</accession><cross_references><pubmed>34295530</pubmed><doi>10.1098/rsos.210511</doi></cross_references></HashMap>