<HashMap><database>biostudies-literature</database><scores/><additional><omics_type>Unknown</omics_type><volume>54(Pt 5)</volume><submitter>Kuhbach M</submitter><funding>Alexander von Humboldt-Stiftung</funding><funding>Max-Planck-Gesellschaft</funding><pubmed_abstract>Volumetric crystal structure indexing and orientation mapping are key data processing steps for virtually any quantitative study of spatial correlations between the local chemical composition features and the microstructure of a material. For electron and X-ray diffraction methods it is possible to develop indexing tools which compare measured and analytically computed patterns to decode the structure and relative orientation within local regions of interest. Consequently, a number of numerically efficient and automated software tools exist to solve the above characterization tasks. For atom-probe tomography (APT) experiments, however, the strategy of making comparisons between measured and analytically computed patterns is less robust because many APT data sets contain substantial noise. </pubmed_abstract><journal>Journal of applied crystallography</journal><pagination>1490-1508</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC8493626</full_dataset_link><repository>biostudies-literature</repository><pubmed_title>Open and strong-scaling tools for atom-probe crystallography: high-throughput methods for indexing crystal structure and orientation.</pubmed_title><pmcid>PMC8493626</pmcid><pubmed_authors>Kuhbach M</pubmed_authors><pubmed_authors>Gault B</pubmed_authors><pubmed_authors>Kasemer M</pubmed_authors><pubmed_authors>Breen A</pubmed_authors></additional><is_claimable>false</is_claimable><name>Open and strong-scaling tools for atom-probe crystallography: high-throughput methods for indexing crystal structure and orientation.</name><description>Volumetric crystal structure indexing and orientation mapping are key data processing steps for virtually any quantitative study of spatial correlations between the local chemical composition features and the microstructure of a material. For electron and X-ray diffraction methods it is possible to develop indexing tools which compare measured and analytically computed patterns to decode the structure and relative orientation within local regions of interest. Consequently, a number of numerically efficient and automated software tools exist to solve the above characterization tasks. For atom-probe tomography (APT) experiments, however, the strategy of making comparisons between measured and analytically computed patterns is less robust because many APT data sets contain substantial noise. </description><dates><release>2021-01-01T00:00:00Z</release><publication>2021 Oct</publication><modification>2026-06-15T04:51:56.892Z</modification><creation>2025-04-04T14:40:04.921Z</creation></dates><accession>S-EPMC8493626</accession><cross_references><pubmed>34667452</pubmed><doi>10.1107/S1600576721008578</doi></cross_references></HashMap>