<HashMap><database>biostudies-literature</database><scores/><additional><submitter>Hoang NT</submitter><funding>National Research Foundation of Korea</funding><pagination>21202</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC8551200</full_dataset_link><repository>biostudies-literature</repository><omics_type>Unknown</omics_type><volume>11(1)</volume><pubmed_abstract>Gallium Telluride (GaTe), a layered material with monoclinic crystal structure, has recently attracted a lot of attention due to its unique physical properties and potential applications for angle-resolved photonics and electronics, where optical anisotropies are important. Despite a few reports on the in-plane anisotropies of GaTe, a comprehensive understanding of them remained unsatisfactory to date. In this work, we investigated thickness-dependent in-plane anisotropies of the 13 Raman-active modes and one Raman-inactive mode of GaTe by using angle-resolved polarized Raman spectroscopy, under both parallel and perpendicular polarization configurations in the spectral range from 20 to 300 cm&lt;sup>-1&lt;/sup>. Raman modes of GaTe revealed distinctly different thickness-dependent anisotropies in parallel polarization configuration while nearly unchanged for the perpendicular configuration. Especially, three A&lt;sub>g&lt;/sub> modes at 40.2 ([Formula: see text]), 152.5 ([Formula: see text]), and 283.8 ([Formula: see text]) cm&lt;sup>-1&lt;/sup> exhibited an evident variation in anisotropic behavior as decreasing thickness down to 9 nm. The observed anisotropies were thoroughly explained by adopting the calculated interference effect and the semiclassical complex Raman tensor analysis.</pubmed_abstract><journal>Scientific reports</journal><pubmed_title>Thickness-dependent in-plane anisotropy of GaTe phonons.</pubmed_title><pmcid>PMC8551200</pmcid><funding_grant_id>2019R1F1A1058473</funding_grant_id><funding_grant_id>2020R1A5A1016518</funding_grant_id><funding_grant_id>2020K1A4A7A02095438</funding_grant_id><funding_grant_id>2019R1A2C1085907</funding_grant_id><pubmed_authors>Vu TH</pubmed_authors><pubmed_authors>Hoang NT</pubmed_authors><pubmed_authors>Seong MJ</pubmed_authors><pubmed_authors>Cho S</pubmed_authors><pubmed_authors>Lee JH</pubmed_authors></additional><is_claimable>false</is_claimable><name>Thickness-dependent in-plane anisotropy of GaTe phonons.</name><description>Gallium Telluride (GaTe), a layered material with monoclinic crystal structure, has recently attracted a lot of attention due to its unique physical properties and potential applications for angle-resolved photonics and electronics, where optical anisotropies are important. Despite a few reports on the in-plane anisotropies of GaTe, a comprehensive understanding of them remained unsatisfactory to date. In this work, we investigated thickness-dependent in-plane anisotropies of the 13 Raman-active modes and one Raman-inactive mode of GaTe by using angle-resolved polarized Raman spectroscopy, under both parallel and perpendicular polarization configurations in the spectral range from 20 to 300 cm&lt;sup>-1&lt;/sup>. Raman modes of GaTe revealed distinctly different thickness-dependent anisotropies in parallel polarization configuration while nearly unchanged for the perpendicular configuration. Especially, three A&lt;sub>g&lt;/sub> modes at 40.2 ([Formula: see text]), 152.5 ([Formula: see text]), and 283.8 ([Formula: see text]) cm&lt;sup>-1&lt;/sup> exhibited an evident variation in anisotropic behavior as decreasing thickness down to 9 nm. The observed anisotropies were thoroughly explained by adopting the calculated interference effect and the semiclassical complex Raman tensor analysis.</description><dates><release>2021-01-01T00:00:00Z</release><publication>2021 Oct</publication><modification>2025-04-18T19:09:55.665Z</modification><creation>2025-04-07T06:51:58.899Z</creation></dates><accession>S-EPMC8551200</accession><cross_references><pubmed>34707186</pubmed><doi>10.1038/s41598-021-00673-0</doi></cross_references></HashMap>