biostudies-literatureUnknown10Liu QBTime-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. Commonly, the quality control of TCMs (traditional Chinese medicines) is limited by the qualitative and quantitative evaluations of the specifically extractive constituents. In this study, a practical sample preparation strategy named two-layered media embedding sample preparation was developed to obtain ideal freezing sections of dried materials of <i>Cordyceps sinensis</i>. Meanwhile, the well-established sample preparation method was applied for <i>in situ</i> chemical profiling and imaginFrontiers in chemistry862007https://www.ebi.ac.uk/biostudies/studies/S-EPMC8987775biostudies-literature<i>In situ</i> Chemical Profiling and Imaging of Cultured and Natural <i>Cordyceps sinensis</i> by TOF-SIMS.PMC8987775Lu JGZhang WQian ZMLiu QBLi WJJiang ZHBai LPfalse<i>In situ</i> Chemical Profiling and Imaging of Cultured and Natural <i>Cordyceps sinensis</i> by TOF-SIMS.Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. Commonly, the quality control of TCMs (traditional Chinese medicines) is limited by the qualitative and quantitative evaluations of the specifically extractive constituents. In this study, a practical sample preparation strategy named two-layered media embedding sample preparation was developed to obtain ideal freezing sections of dried materials of <i>Cordyceps sinensis</i>. Meanwhile, the well-established sample preparation method was applied for <i>in situ</i> chemical profiling and imagin2022-01-01T00:00:00Z20222025-04-19T12:54:34.108Z2025-04-19T12:54:34.108ZS-EPMC89877753540238910.3389/fchem.2022.862007