{"database":"biostudies-literature","file_versions":[],"scores":null,"additional":{"submitter":["De Castro O"],"funding":["Fonds National de la Recherche Luxembourg"],"pagination":["10754-10763"],"full_dataset_link":["https://www.ebi.ac.uk/biostudies/studies/S-EPMC9352148"],"repository":["biostudies-literature"],"omics_type":["Unknown"],"volume":["94(30)"],"pubmed_abstract":["The structural, morphological, and chemical characterization of samples is of utmost importance for a large number of scientific fields. Furthermore, this characterization very often needs to be performed in three dimensions and at length scales down to the nanometer. Therefore, there is a stringent necessity to develop appropriate instrumentational solutions to fulfill these needs. Here we report on the deployment of magnetic sector secondary ion mass spectrometry (SIMS) on a type of instrument widely used for such nanoscale investigations, namely, focused ion beam (FIB)-scanning electron microscopy (SEM) instruments. First, we present the layout of the FIB-SEM-SIMS instrument and address its performance by using specific test samples. The achieved performance can be summarized as follows: an overall secondary ion beam transmission above 40%, a mass resolving power (<i>M</i>/Δ<i>M</i>) of more than 400, a detectable mass range from 1 to 400 amu, a lateral resolution in two-dimensional (2D) chemical imaging mode of 15 nm, and a depth resolution of ∼4 nm at 3.0 keV of beam landing energy. Second, we show results (depth profiling, 2D imaging, three-dimensional imaging) obtained in a wide range of areas, such as battery research, photovoltaics, multilayered samples, and life science applications. We hereby highlight the system's versatile capability of conducting high-performance correlative studies in the fields of materials science and life sciences."],"journal":["Analytical chemistry"],"pubmed_title":["Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging."],"pmcid":["PMC9352148"],"funding_grant_id":["INTER/ANR/18/12545362","INTER/DFG/17/11779689"],"pubmed_authors":["Barrahma R","Stoffels C","Geryk M","Bouton O","Dutka M","Coulbary C","Jiao C","Audinot JN","De Castro O","Hoang HQ","Wirtz T","Ost A"],"additional_accession":[]},"is_claimable":false,"name":"Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging.","description":"The structural, morphological, and chemical characterization of samples is of utmost importance for a large number of scientific fields. Furthermore, this characterization very often needs to be performed in three dimensions and at length scales down to the nanometer. Therefore, there is a stringent necessity to develop appropriate instrumentational solutions to fulfill these needs. Here we report on the deployment of magnetic sector secondary ion mass spectrometry (SIMS) on a type of instrument widely used for such nanoscale investigations, namely, focused ion beam (FIB)-scanning electron microscopy (SEM) instruments. First, we present the layout of the FIB-SEM-SIMS instrument and address its performance by using specific test samples. The achieved performance can be summarized as follows: an overall secondary ion beam transmission above 40%, a mass resolving power (<i>M</i>/Δ<i>M</i>) of more than 400, a detectable mass range from 1 to 400 amu, a lateral resolution in two-dimensional (2D) chemical imaging mode of 15 nm, and a depth resolution of ∼4 nm at 3.0 keV of beam landing energy. Second, we show results (depth profiling, 2D imaging, three-dimensional imaging) obtained in a wide range of areas, such as battery research, photovoltaics, multilayered samples, and life science applications. We hereby highlight the system's versatile capability of conducting high-performance correlative studies in the fields of materials science and life sciences.","dates":{"release":"2022-01-01T00:00:00Z","publication":"2022 Aug","modification":"2025-04-05T08:55:31.527Z","creation":"2025-02-19T04:54:26.033Z"},"accession":"S-EPMC9352148","cross_references":{"pubmed":["35862487"],"doi":["10.1021/acs.analchem.2c01410"]}}