{"database":"biostudies-literature","file_versions":[],"scores":null,"additional":{"submitter":["Hari S"],"funding":["Dutch Research Council (NWO)","ZonMw","NanoNextNL, a consortium of the Dutch government and 130 public and private partners."],"pagination":["20185"],"full_dataset_link":["https://www.ebi.ac.uk/biostudies/studies/S-EPMC9684522"],"repository":["biostudies-literature"],"omics_type":["Unknown"],"volume":["12(1)"],"pubmed_abstract":["Super-resolution fluorescence microscopy can be achieved by image reconstruction after spatially patterned illumination or sequential photo-switching and read-out. Reconstruction algorithms and microscope performance are typically tested using simulated image data, due to a lack of strategies to pattern complex fluorescent patterns with nanoscale dimension control. Here, we report direct electron-beam patterning of fluorescence nanopatterns as calibration standards for super-resolution fluorescence. Patterned regions are identified with both electron microscopy and fluorescence labelling of choice, allowing precise correlation of predefined pattern dimensions, a posteriori obtained electron images, and reconstructed super-resolution images."],"journal":["Scientific reports"],"pubmed_title":["Electron-beam patterned calibration structures for structured illumination microscopy."],"pmcid":["PMC9684522"],"funding_grant_id":["435002021","711.016.003","ECHO-711.016.003"],"pubmed_authors":["Hoogenboom JP","Vos Y","Floris C","Houtsmuller AB","Stallinga S","Slotman JA","Hari S","Hagen CW","van Cappellen WA"],"additional_accession":[]},"is_claimable":false,"name":"Electron-beam patterned calibration structures for structured illumination microscopy.","description":"Super-resolution fluorescence microscopy can be achieved by image reconstruction after spatially patterned illumination or sequential photo-switching and read-out. Reconstruction algorithms and microscope performance are typically tested using simulated image data, due to a lack of strategies to pattern complex fluorescent patterns with nanoscale dimension control. Here, we report direct electron-beam patterning of fluorescence nanopatterns as calibration standards for super-resolution fluorescence. Patterned regions are identified with both electron microscopy and fluorescence labelling of choice, allowing precise correlation of predefined pattern dimensions, a posteriori obtained electron images, and reconstructed super-resolution images.","dates":{"release":"2022-01-01T00:00:00Z","publication":"2022 Nov","modification":"2025-04-18T14:59:37.477Z","creation":"2025-04-07T01:26:14.385Z"},"accession":"S-EPMC9684522","cross_references":{"pubmed":["36418420"],"doi":["10.1038/s41598-022-24502-0"]}}