<HashMap><database>biostudies-literature</database><scores/><additional><submitter>Hari S</submitter><funding>Dutch Research Council (NWO)</funding><funding>ZonMw</funding><funding>NanoNextNL, a consortium of the Dutch government and 130 public and private partners.</funding><pagination>20185</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC9684522</full_dataset_link><repository>biostudies-literature</repository><omics_type>Unknown</omics_type><volume>12(1)</volume><pubmed_abstract>Super-resolution fluorescence microscopy can be achieved by image reconstruction after spatially patterned illumination or sequential photo-switching and read-out. Reconstruction algorithms and microscope performance are typically tested using simulated image data, due to a lack of strategies to pattern complex fluorescent patterns with nanoscale dimension control. Here, we report direct electron-beam patterning of fluorescence nanopatterns as calibration standards for super-resolution fluorescence. Patterned regions are identified with both electron microscopy and fluorescence labelling of choice, allowing precise correlation of predefined pattern dimensions, a posteriori obtained electron images, and reconstructed super-resolution images.</pubmed_abstract><journal>Scientific reports</journal><pubmed_title>Electron-beam patterned calibration structures for structured illumination microscopy.</pubmed_title><pmcid>PMC9684522</pmcid><funding_grant_id>435002021</funding_grant_id><funding_grant_id>711.016.003</funding_grant_id><funding_grant_id>ECHO-711.016.003</funding_grant_id><pubmed_authors>Hoogenboom JP</pubmed_authors><pubmed_authors>Vos Y</pubmed_authors><pubmed_authors>Floris C</pubmed_authors><pubmed_authors>Houtsmuller AB</pubmed_authors><pubmed_authors>Stallinga S</pubmed_authors><pubmed_authors>Slotman JA</pubmed_authors><pubmed_authors>Hari S</pubmed_authors><pubmed_authors>Hagen CW</pubmed_authors><pubmed_authors>van Cappellen WA</pubmed_authors></additional><is_claimable>false</is_claimable><name>Electron-beam patterned calibration structures for structured illumination microscopy.</name><description>Super-resolution fluorescence microscopy can be achieved by image reconstruction after spatially patterned illumination or sequential photo-switching and read-out. Reconstruction algorithms and microscope performance are typically tested using simulated image data, due to a lack of strategies to pattern complex fluorescent patterns with nanoscale dimension control. Here, we report direct electron-beam patterning of fluorescence nanopatterns as calibration standards for super-resolution fluorescence. Patterned regions are identified with both electron microscopy and fluorescence labelling of choice, allowing precise correlation of predefined pattern dimensions, a posteriori obtained electron images, and reconstructed super-resolution images.</description><dates><release>2022-01-01T00:00:00Z</release><publication>2022 Nov</publication><modification>2025-04-18T14:59:37.477Z</modification><creation>2025-04-07T01:26:14.385Z</creation></dates><accession>S-EPMC9684522</accession><cross_references><pubmed>36418420</pubmed><doi>10.1038/s41598-022-24502-0</doi></cross_references></HashMap>