<HashMap><database>biostudies-literature</database><scores/><additional><submitter>Riedl C</submitter><funding>Österreichische Forschungsförderungsgesellschaft</funding><funding>Austrian Science Fund FWF</funding><pagination>142-153</pagination><full_dataset_link>https://www.ebi.ac.uk/biostudies/studies/S-EPMC9768847</full_dataset_link><repository>biostudies-literature</repository><omics_type>Unknown</omics_type><volume>25(1)</volume><pubmed_abstract>La&lt;sub>0.6&lt;/sub>Sr&lt;sub>0.4&lt;/sub>FeO&lt;sub>3-&lt;i>δ&lt;/i>&lt;/sub> (LSF) electrodes were grown on different electrolyte substrates by pulsed laser deposition (PLD) and their oxygen exchange reaction (OER) resistance was tracked in real-time by &lt;i>in situ&lt;/i> PLD impedance spectroscopy (i-PLD) inside the PLD chamber. This enables measurements on pristine surfaces free from any contaminations and the direct observation of thickness dependent properties. As substrates, yttria-stabilized zirconia single crystals (YSZ) were used for polycrystalline LSF growth and La&lt;sub>0.95&lt;/sub>Sr&lt;sub>0.05&lt;/sub>Ga&lt;sub>0.95&lt;/sub>Mg&lt;sub>0.05&lt;/sub>O&lt;sub>3-&lt;i>δ&lt;/i>&lt;/sub> (LSGM) single crystals or YSZ single crystals with a 5 nm buffer-layer of Gd&lt;sub>0.2&lt;/sub>Ce&lt;sub>0.8&lt;/sub>O&lt;sub>2-&lt;i>δ&lt;/i>&lt;/sub> for epitaxial LSF film growth. While polycrystalline LSF electrodes show a constant OER resistance in a broad thickness range, epitaxially grown LSF electrodes exhibit a continuous and strong increase of the OER resistance with film thickness until ≈60 nm. In addition, the activation energy of the OER resistance increases by 0.23 eV compared to polycrystalline LSF. High resolution transmission electron microscopy (HRTEM) and X-ray diffraction (XRD) measurements reveal an increasing contraction of the out-of-plane lattice parameter in the epitaxial LSF electrodes over electrode thickness. Defect thermodynamic simulations suggest that the decrease of the LSF unit cell volume is accompanied by a lowering of the oxygen vacancy concentration, explaining both the resistive increase and the increased activation energy.</pubmed_abstract><journal>Physical chemistry chemical physics : PCCP</journal><pubmed_title>&lt;i>In situ&lt;/i> electrochemical observation of anisotropic lattice contraction of La&lt;sub>0.6&lt;/sub>Sr&lt;sub>0.4&lt;/sub>FeO&lt;sub>3-&lt;i>δ&lt;/i>&lt;/sub> electrodes during pulsed laser deposition.</pubmed_title><pmcid>PMC9768847</pmcid><funding_grant_id>P31654 – N37</funding_grant_id><funding_grant_id>P31165 – N37</funding_grant_id><funding_grant_id>865864</funding_grant_id><pubmed_authors>Limbeck A</pubmed_authors><pubmed_authors>Siebenhofer M</pubmed_authors><pubmed_authors>Opitz AK</pubmed_authors><pubmed_authors>Riedl C</pubmed_authors><pubmed_authors>Raznjevic S</pubmed_authors><pubmed_authors>Zhang Z</pubmed_authors><pubmed_authors>Fleig J</pubmed_authors><pubmed_authors>Bumberger AE</pubmed_authors><pubmed_authors>Kubicek M</pubmed_authors></additional><is_claimable>false</is_claimable><name>&lt;i>In situ&lt;/i> electrochemical observation of anisotropic lattice contraction of La&lt;sub>0.6&lt;/sub>Sr&lt;sub>0.4&lt;/sub>FeO&lt;sub>3-&lt;i>δ&lt;/i>&lt;/sub> electrodes during pulsed laser deposition.</name><description>La&lt;sub>0.6&lt;/sub>Sr&lt;sub>0.4&lt;/sub>FeO&lt;sub>3-&lt;i>δ&lt;/i>&lt;/sub> (LSF) electrodes were grown on different electrolyte substrates by pulsed laser deposition (PLD) and their oxygen exchange reaction (OER) resistance was tracked in real-time by &lt;i>in situ&lt;/i> PLD impedance spectroscopy (i-PLD) inside the PLD chamber. This enables measurements on pristine surfaces free from any contaminations and the direct observation of thickness dependent properties. As substrates, yttria-stabilized zirconia single crystals (YSZ) were used for polycrystalline LSF growth and La&lt;sub>0.95&lt;/sub>Sr&lt;sub>0.05&lt;/sub>Ga&lt;sub>0.95&lt;/sub>Mg&lt;sub>0.05&lt;/sub>O&lt;sub>3-&lt;i>δ&lt;/i>&lt;/sub> (LSGM) single crystals or YSZ single crystals with a 5 nm buffer-layer of Gd&lt;sub>0.2&lt;/sub>Ce&lt;sub>0.8&lt;/sub>O&lt;sub>2-&lt;i>δ&lt;/i>&lt;/sub> for epitaxial LSF film growth. While polycrystalline LSF electrodes show a constant OER resistance in a broad thickness range, epitaxially grown LSF electrodes exhibit a continuous and strong increase of the OER resistance with film thickness until ≈60 nm. In addition, the activation energy of the OER resistance increases by 0.23 eV compared to polycrystalline LSF. High resolution transmission electron microscopy (HRTEM) and X-ray diffraction (XRD) measurements reveal an increasing contraction of the out-of-plane lattice parameter in the epitaxial LSF electrodes over electrode thickness. Defect thermodynamic simulations suggest that the decrease of the LSF unit cell volume is accompanied by a lowering of the oxygen vacancy concentration, explaining both the resistive increase and the increased activation energy.</description><dates><release>2022-01-01T00:00:00Z</release><publication>2022 Dec</publication><modification>2025-04-04T10:59:01.919Z</modification><creation>2025-04-04T10:59:01.919Z</creation></dates><accession>S-EPMC9768847</accession><cross_references><pubmed>36476841</pubmed><doi>10.1039/d2cp04977e</doi></cross_references></HashMap>