Low-energy electron microscopy intensity-voltage data - Factorization, sparse sampling and classification.

ABSTRACT: Low-energy electron microscopy (LEEM) taken as intensity-voltage (I-V) curves provides hyperspectral images of surfaces, which can be used to identify the surface type, but are difficult to analyse. Here, we demonstrate the use of an algorithm for factorizing the data into spectra and concentrations of characteristic components (FSC³ ) for identifying distinct physical surface phases. Importantly, FSC³ is an unsupervised and fast algorithm. As example data we use experiments on the growth of praseodymium oxide or ruthenium oxide on ruthenium single crystal substrates, both featuring a complex distribution of coexisting surface components, varying in both chemical composition and crystallographic structure. With the factorization result a sparse sampling method is demo

SUBMITTER: Masia F 

PROVIDER: S-EPMC10108219 | biostudies-literature | 2023 Feb

REPOSITORIES: biostudies-literature