Mapping a leaf rust resistance gene LrOft in durum wheat Ofanto and its suppressor SuLrOft in common wheat.

ABSTRACT: Epidemics of leaf rust (caused by the fungal pathogen Puccinia triticina Erikss., Pt) raise concerns regarding sustainability of wheat production. Deployment of resistant cultivars is the most effective and economic strategy for combating this disease. Ofanto is a durum wheat cultivar that exhibits high resistance to Pt race PHT throughout its entire growing period. In the present study, we identified a leaf rust resistance gene in Ofanto and temporarily designated it as LrOft. LrOft was mapped to a 2.5 cM genetic interval in chromosome arm 6BL between Indel markers 6B6941 and 6B50L24. During introgression of LrOft from Ofanto to common wheat it was observed that F₁ plants of Ofanto crossed with Shi4185 exhibited leaf rust

SUBMITTER: Zhuansun X 

PROVIDER: S-EPMC10161252 | biostudies-literature | 2023

REPOSITORIES: biostudies-literature