Solid Platinum Nanoprobes for Highly Reliable Conductive Atomic Force Microscopy.

ABSTRACT: Conductive atomic force microscopy (CAFM) is a powerful technique to investigate electrical and mechanical properties of materials and devices at the nanoscale. However, its main challenge is the reliability of the probe tips and their interaction with the samples. The most common probe tips used in CAFM studies are made of Si coated with a thin (∼20 nm) film of Pt or Pt-rich alloys (such as Pt/Ir), but this can degrade fast due to high current densities (>10²A/cm²) and mechanical frictions. Si tips coated with doped diamond and solid doped diamond tips are more durable, but they are significantly more expensive and their high stiffness often damages the surface of most samples. One growing alternative is to use solid Pt tips, which have an intermediate price and are

SUBMITTER: Weber J 

PROVIDER: S-EPMC10165598 | biostudies-literature | 2023 May

REPOSITORIES: biostudies-literature