Non-Markovian Hole Excess Noise in Avalanche Amorphous Selenium Thin Films.

ABSTRACT: Enhancing the signal-to-noise ratio in avalanche photodiodes by utilizing impact ionization gain requires materials exhibiting low excess noise factors. Amorphous selenium (a-Se) as a wide bandgap at ∼2.1 eV, a solid-state avalanche layer, demonstrates single-carrier hole impact ionization gain and manifests ultralow thermal generation rates. A comprehensive study of the history dependent and non-Markovian nature of hot hole transport in a-Se was modeled using a Monte Carlo (MC) random walk of single hole free flights, interrupted by instantaneous phonon, disorder, hole-dipole, and impact-ionization scattering interactions. The hole excess noise factors were simulated for 0.1-15 μm a-Se thin-films as a function of mean avalanche gain. The hole excess noise factors in <

SUBMITTER: Mukherjee A 

PROVIDER: S-EPMC10324078 | biostudies-literature | 2023 Jul

REPOSITORIES: biostudies-literature