On the quantification of sample microstructure using single-exposure x-ray dark-field imaging via a single-grid setup.

ABSTRACT: The size of the smallest detectable sample feature in an x-ray imaging system is usually restricted by the spatial resolution of the system. This limitation can now be overcome using the diffusive dark-field signal, which is generated by unresolved phase effects or the ultra-small-angle x-ray scattering from unresolved sample microstructures. A quantitative measure of this dark-field signal can be useful in revealing the microstructure size or material for medical diagnosis, security screening and materials science. Recently, we derived a new method to quantify the diffusive dark-field signal in terms of a scattering angle using a single-exposure grid-based approach. In this manuscript, we look at the problem of quantifying the sample microstructure size from this single-exposure dark-fiel

SUBMITTER: How YY 

PROVIDER: S-EPMC10329004 | biostudies-literature | 2023 Jul

REPOSITORIES: biostudies-literature