Molecular mapping of two novel cold resistance genes in common wheat by 660K SNP array.

ABSTRACT: Low temperature and cold damage are natural factors that seriously reduce wheat yield. Thus, how to improve the cold resistance of wheat has been the focus of wheat breeders and geneticists. However, the genetic improvement for this trait has been slow, mainly because cold resistance is a complex quantitative trait and field phenotypic identification is relatively difficult. Therefore, the discovery, mapping, and cloning of the cold resistance genes of wheat provide a theoretical basis for the genetic improvement of wheat against cold resistance and facilitate the analysis of the molecular mechanisms of cold resistance in wheat. This study used the wheat line H261 and its EMS mutants LF2099 and XiNong 239 as materials. Cold trait segregation occurred in the F₂ generation of muta

SUBMITTER: Lei C 

PROVIDER: S-EPMC10665288 | biostudies-literature | 2023 Dec

REPOSITORIES: biostudies-literature