A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements.

ABSTRACT: Measuring resistances at the nanoscale has attracted recent attention for developing microelectronic components, memory devices, molecular electronics, and two-dimensional materials. Despite the decisive contribution of scanning probe microscopy in imaging resistance and current variations, measurements have remained restricted to qualitative comparisons. Reference resistance calibration samples are key to advancing the research-to-manufacturing process of nanoscale devices and materials through calibrated, reliable, and comparable measurements. No such calibration reference samples have been proposed so far. In this work, we demonstrate the development of a multi-resistance reference sample for calibrating resistance measurements in conductive probe atomic force microscopy (C-AFM) coverin

SUBMITTER: Piquemal F 

PROVIDER: S-EPMC10682512 | biostudies-literature | 2023

REPOSITORIES: biostudies-literature