Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function.

ABSTRACT: AFM sharp tips are used to characterize nanostructures and quantify the mechanical properties of the materials in several areas of research. The analytical results can show unpredicted errors if we do not know the exact values of the AFM tip radius. There are many techniques of in situ measurements for determining the actual AFM tip radius, but they are limited to uncoated tips. This paper presents an alternative and simple method to determine the radii of coated tips and an uncoated tip. Pt-coated, Cr/Au-coated, and uncoated Si tips were used to scan a calibration standard grating in AFM contact mode with sub-nanonewton load to obtain the curved scan profile of the edge corner of the grating structure. The data points of the curved profile of each tip were fitted with a nonlinear regressi

SUBMITTER: Boonpuek P 

PROVIDER: S-EPMC10729132 | biostudies-literature | 2023

REPOSITORIES: biostudies-literature