Monitoring of semiconductor manufacturing process on Bayesian AEWMA control chart under paired ranked set sampling schemes.

ABSTRACT: Quality control often employs memory-type control charts, including the exponentially weighted moving average (EWMA) and Shewhart control charts, to identify shifts in the location parameter of a process. This article pioneers a new Bayesian Adaptive EWMA (AEWMA) control chart, built on diverse loss functions (LFs) such as the square error loss function (SELF) and the Linex loss function (LLF). The proposed chart aims to enhance the process of identifying small to moderate as well as significant shifts in the mean, signifying a notable advancement in the field of quality control. These are implemented utilizing an informative prior for both posterior and posterior predictive distributions, employing various paired ranked set sampling (PRSS) schemes. The effectiveness of the suggested chart

SUBMITTER: Wang Y 

PROVIDER: S-EPMC10733340 | biostudies-literature | 2023 Dec

REPOSITORIES: biostudies-literature