Free-electron Ramsey-type interferometry for enhanced amplitude and phase imaging of nearfields.

ABSTRACT: The complex range of interactions between electrons and electromagnetic fields gave rise to countless scientific and technological advances. A prime example is photon-induced nearfield electron microscopy (PINEM), enabling the detection of confined electric fields in illuminated nanostructures with unprecedented spatial resolution. However, PINEM is limited by its dependence on strong fields, making it unsuitable for sensitive samples, and its inability to resolve complex phasor information. Here, we leverage the nonlinear, overconstrained nature of PINEM to present an algorithmic microscopy approach, achieving far superior nearfield imaging capabilities. Our algorithm relies on free-electron Ramsey-type interferometry to produce orders-of-magnitude improvement in sensitivity and ambiguity

SUBMITTER: Bucher T 

PROVIDER: S-EPMC10745688 | biostudies-literature | 2023 Dec

REPOSITORIES: biostudies-literature