Improved Method for Electron Powder Diffraction-Based Rietveld Analysis of Nanomaterials.

ABSTRACT: Multiphase nanomaterials are of increasing importance in material science. Providing reliable and statistically meaningful information on their average nanostructure is essential for synthesis control and applications. In this paper, we propose a novel procedure that simplifies and makes more effective the electron powder diffraction-based Rietveld analysis of nanomaterials. Our single step in-TEM method allows to obtain the instrumental broadening function of the TEM directly from a single measurement without the need for an additional X-ray diffraction measurement. Using a multilayer graphene calibration standard and applying properly controlled acquisition conditions on a spherical aberration-corrected microscope, we achieved the instrumental broadening of ±0.01 Å in terms of interplana

SUBMITTER: Kis VK 

PROVIDER: S-EPMC10934415 | biostudies-literature | 2024 Feb

REPOSITORIES: biostudies-literature