Kinetics of N- to M-Polar Switching in Ferroelectric Al_1-xSc_xN Capacitors.

ABSTRACT: Ferroelectric wurtzite-type aluminum scandium nitride (Al_1-xSc_xN) presents unique properties that can enhance the performance of non-volatile memory technologies. The realization of the full potential of Al_1-xSc_xN requires a comprehensive understanding of the mechanism of polarization reversal and domain structure dynamics involved in the ferroelectric switching process. In this work, transient current integration measurements performed by a pulse switching method are combined with domain imaging by piezoresponse force microscopy (PFM) to investigate the kinetics of domain nucleation and wall motion during polarization reversal in Al_0.85Sc_0.15N capacitors. In the studied electric field range (from 4.4 to 5.6 MV cm^-1

SUBMITTER: Guido R 

PROVIDER: S-EPMC11040360 | biostudies-literature | 2024 Apr

REPOSITORIES: biostudies-literature