Exploring the Association Between EEG Microstates During Resting-State and Error-Related Activity in Young Children.

ABSTRACT: The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error processing during early childhood is unclear. We examined the relationship between the ERN and EEG microstates - whole-brain patterns of dynamically evolving scalp potential topographies that reflect periods of synchronized neural activity - during both a go/no-go task and resting-state in 90, 4-8-year-old children. The mean amplitude of the ERN was quantified during the -64 to 108 millisecond (ms) period of time relative to error commission, which was determined by data-driven microstate segmentati

SUBMITTER: Bagdasarov A 

PROVIDER: S-EPMC11199242 | biostudies-literature | 2024 Jul

REPOSITORIES: biostudies-literature