Atomically Resolved Defect-Engineering Scattering Potential in 2D Semiconductors.
Ontology highlight
ABSTRACT: Engineering atomic-scale defects has become an important strategy for the future application of transition metal dichalcogenide (TMD) materials in next-generation electronic technologies. Thus, providing an atomic understanding of the electron-defect interactions and supporting defect engineering development to improve carrier transport is crucial to future TMDs technologies. In this work, we utilize low-temperature scanning tunneling microscopy/spectroscopy (LT-STM/S) to elicit how distinct types of defects bring forth scattering potential engineering based on intervalley quantum quasiparticle interference (QPI) in TMDs. Furthermore, quantifying the energy-dependent phase variation of the QPI standing wave reveals the detailed electron-defect interaction between the substitution-induced s
SUBMITTER: Chen HY
PROVIDER: S-EPMC11238616 | biostudies-literature | 2024 Jul
REPOSITORIES: biostudies-literature
ACCESS DATA