Posterior approach to correct for focal plane offsets in lattice light-sheet structured illumination microscopy.

ABSTRACT:

Significance

Lattice light-sheet structured illumination microscopy (latticeSIM) has proven highly effective in producing three-dimensional images with super resolution rapidly and with minimal photobleaching. However, due to the use of two separate objectives, sample-induced aberrations can result in an offset between the planes of excitation and detection, causing artifacts in the reconstructed images.

Aim

We introduce a posterior approach to detect and correct the axial offset between the excitation and detection focal planes in latticeSIM and provide a method to minimize artifacts in the reconstructed images.

Approach

We utilized the residual phase information within the overlap regions of the laterally shifted structured illumination microscopy information compon

SUBMITTER: Shi Y 

PROVIDER: S-EPMC11289499 | biostudies-literature | 2024 Aug

REPOSITORIES: biostudies-literature