Scanning Plasmon-Enhanced Microscopy for Simultaneous Optoelectrical Characterization.

ABSTRACT: Scanning microscopy methods are crucial for the advancement of nanoelectronics. However, the vertical nanoprobes in such techniques suffer limitations such as the fragility at the tip-sample interface, complex instrumentation, and the lack of in operando functionality in several cases. Here, we introduce scanning plasmon-enhanced microscopy (SPEM) and demonstrate its capabilities on MoS₂ and WSe₂ nanosheets. SPEM combines a nanoparticle-on-mirror (NPoM) configuration with a portable conductive cantilever, enabling simultaneous optical and electrical characterization. This distinguishes it from other current techniques that cannot provide both characterizations simultaneously. It offers a competitive optical resolution of 600 nm with local enhancement of optical signal

SUBMITTER: Symonowicz J 

PROVIDER: S-EPMC11308916 | biostudies-literature | 2024 Jul

REPOSITORIES: biostudies-literature