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Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy.

ABSTRACT: Serial section transmission electron microscopy (TEM) has proven to be one of the leading methods for millimeter-scale 3D imaging of brain tissues at nanoscale resolution. It is important to further improve imaging efficiency to acquire larger and more brain volumes. We report here a threefold increase in the speed of TEM by using a beam deflecting mechanism to enable highly efficient acquisition of multiple image tiles (nine) for each motion of the mechanical stage. For millimeter-scale areas, the duty cycle of imaging doubles to more than 30%, yielding a net average imaging rate of 0.3 gigapixels per second. If fully utilized, an array of four beam deflection TEMs should be capable of imaging a dataset of cubic millimeter scale in five weeks.

SUBMITTER: Zheng Z

PROVIDER: S-EPMC11316758 | biostudies-literature | 2024 Aug

REPOSITORIES: biostudies-literature

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Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy.

Zheng Zhihao Z Own Christopher S CS Wanner Adrian A AA Koene Randal A RA Hammerschmith Eric W EW Silversmith William M WM Kemnitz Nico N Lu Ran R Tank David W DW Seung H Sebastian HS

Nature communications 20240810 1

Serial section transmission electron microscopy (TEM) has proven to be one of the leading methods for millimeter-scale 3D imaging of brain tissues at nanoscale resolution. It is important to further improve imaging efficiency to acquire larger and more brain volumes. We report here a threefold increase in the speed of TEM by using a beam deflecting mechanism to enable highly efficient acquisition of multiple image tiles (nine) for each motion of the mechanical stage. For millimeter-scale areas, ...[more]

PMID: 39127683

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