Surface polarization profile of ferroelectric thin films probed by X-ray standing waves and photoelectron spectroscopy.

ABSTRACT: Understanding the mechanisms underlying a stable polarization at the surface of ferroelectric thin films is of particular importance both from a fundamental point of view and to achieve control of the surface polarization itself. In this study, we demonstrate that the X-ray standing wave technique allows the surface polarization profile of a ferroelectric thin film, as opposed to the average film polarity, to be probed directly. The X-ray standing wave technique provides the average Ti and Ba atomic positions, along the out-of-plane direction, near the surface of three differently strained [Formula: see text] thin films. This technique gives direct access to the local ferroelectric polarization at and below the surface. By employing X-ray photoelectron spectroscopy, a detailed overview of

SUBMITTER: Hoang LP 

PROVIDER: S-EPMC11484970 | biostudies-literature | 2024 Oct

REPOSITORIES: biostudies-literature