Light-modulated van der Waals force microscopy.

ABSTRACT: Atomic force microscope generally works by manipulating the absolute magnitude of the van der Waals force between tip and specimen. This force is, however, less sensitive to atom species than to tip-sample separations, making compositional identification difficult, even under multi-modal strategies or other atomic force microscopy variations. Here, we report the phenomenon of a light-modulated tip-sample van der Waals force whose magnitude is found to be material specific, which can be employed to discriminate heterogeneous compositions of materials. We thus establish a near-field microscopic method, named light-modulated van der Waals force microscopy. Experiments discriminating heterogeneous crystalline phases or compositions in typical materials demonstrate a high compositional resolvin

SUBMITTER: Han YX 

PROVIDER: S-EPMC11496536 | biostudies-literature | 2024 Oct

REPOSITORIES: biostudies-literature