High-fidelity nano-FTIR spectroscopy by on-pixel normalization of signal harmonics.

ABSTRACT: Scattering-type scanning near-field optical microscopy (s-SNOM) and Fourier transform infrared nanospectroscopy (nano-FTIR) are emerging tools for physical and chemical nanocharacterization of organic and inorganic composite materials. Being based on (i) diffraction-limited illumination of a scanning probe tip for nanofocusing of light and (ii) recording of the tip-scattered radiation, the efficient suppression of background scattering has been critical for their success. Here, we show that indirect tip illumination via far-field reflection and scattering at the sample can produce s-SNOM and nano-FTIR signals of materials that are not present at the tip position - despite full background suppression. Although these artefacts occur primarily on or near large sample structures,

SUBMITTER: Mester L 

PROVIDER: S-EPMC11501567 | biostudies-literature | 2022 Jan

REPOSITORIES: biostudies-literature