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ABSTRACT: Background
As software and hardware have developed, so has the scale of research into volume electron microscopy (vEM), leading to ever-increasing resolution. Usually, data collection is followed by image stitching: the same area is subjected to high-resolution imaging with a certain overlap, and then the images are stitched together to achieve ultrastructure with large scale and high resolution simultaneously. However, there is currently no perfect method for image stitching, especially when the global feature distribution of the sample is uneven and the feature points of the overlap area cannot be matched accurately, which results in ghosting of the fusion area.Results
We have developed a novel algorithm called vEMstitch to solve these problems, aiming for seamless and cl
SUBMITTER: He B
PROVIDER: S-EPMC11512480 | biostudies-literature | 2024 Jan
REPOSITORIES: biostudies-literature