Through-the-glass spectroscopic ellipsometry for analysis of the optical structure of CdTe thin-film solar cells in the superstrate configuration.

ABSTRACT: The polycrystalline CdS/CdTe thin-film solar cell in the superstrate configuration has been studied by spectroscopic ellipsometry (SE) using glass side illumination whereby the reflection from the glass/film-stack interface is collected whereas that from the ambient/glass interface is rejected. The SE data analysis applies dielectric functions ( ε ) for solar cell component materials obtained by variable-angle and in-situ SE. In the SE analysis of the complete cell, a step-wise procedure ranks the free parameters, including thicknesses and those defining the spectra in ε , according to their ability to reduce the root-mean-square deviation between simulated and measured SE spectra, and the best-fit results compare well with electron microscopy. Combining all SE results, the solar cell quan

SUBMITTER: Koirala P 

PROVIDER: S-EPMC11561885 | biostudies-literature | 2016

REPOSITORIES: biostudies-literature