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ABSTRACT: Summary
Although multiple neural networks have been proposed for detecting secondary structures from medium-resolution (5-10 Å) cryo-electron microscopy (cryo-EM) maps, the loss functions used in the existing deep learning networks are primarily based on cross-entropy loss, which is known to be sensitive to class imbalances. We investigated five loss functions: cross-entropy, Focal loss, Dice loss, and two combined loss functions. Using a U-Net architecture in our DeepSSETracer method and a dataset composed of 1355 box-cropped atomic-structure/density-map pairs, we found that a newly designed loss function that combines Focal loss and Dice loss provides the best overall detection accuracy for secondary structures. For β-sheet voxels, which are generally much harder to detect than h
SUBMITTER: Mu Y
PROVIDER: S-EPMC11590252 | biostudies-literature | 2024
REPOSITORIES: biostudies-literature