A stochastic encoder using point defects in two-dimensional materials.

ABSTRACT: While defects are undesirable for the reliability of electronic devices, particularly in scaled microelectronics, they have proven beneficial in numerous quantum and energy-harvesting applications. However, their potential for new computational paradigms, such as neuromorphic and brain-inspired computing, remains largely untapped. In this study, we harness defects in aggressively scaled field-effect transistors based on two-dimensional semiconductors to accelerate a stochastic inference engine that offers remarkable noise resilience. We use atomistic imaging, density functional theory calculations, device modeling, and low-temperature transport experiments to offer comprehensive insight into point defects in WSe₂ FETs and their impact on random telegraph noise. We then use rando

SUBMITTER: Ravichandran H 

PROVIDER: S-EPMC11618794 | biostudies-literature | 2024 Dec

REPOSITORIES: biostudies-literature