Diffusion distribution model for damage mitigation in scanning transmission electron microscopy.

ABSTRACT: Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent reports suggest that certain types of damage can be modelled as a diffusion process and that the accumulation effects of this process must be kept low in order to reduce damage. We therefore develop an explicit mathematical formulation of spatiotemporal diffusion processes in STEM that take into account both instrument and sample parameters. Furthermore, our framework can aid the design of Diffusion Controlled Sampling (DCS) strategies using optimally selected probe positions in STEM, that constrain the cumulative diffusion distribution. Numerical simulations

SUBMITTER: Moshtaghpour A 

PROVIDER: S-EPMC11629935 | biostudies-literature | 2025 Jan

REPOSITORIES: biostudies-literature