Single- and multi-locus genome-wide association study reveals genomic regions of thirteen yield-related traits in common wheat.

ABSTRACT: Genetic dissection of yield-related traits can be used to improve wheat yield through molecular design breeding. In this study, we genotyped 245 wheat varieties and measured 13 yield-related plant height-, grain-, and spike-related traits, in seven environments, and identified 778 loci for these traits by genome-wide association study (GWAS) using single- and multi-locus models. Among these loci, nine were major, of which seven were novel, including Qph/lph.ahau-7A for plant height (PH) and leaf pillow height (LPH), Qngps/sps.ahau-1A for number of grains per spike (NGPS) and spikelet number per spike (SPS), Qsd.ahau-2B.1 and Qsd.ahau-5A.2 for spikelet density (SD), Qlph.ahau-7B.2 for LPH, Qgl.ahau-7B.3 for grain length (GL), and Qsl.ahau-3A.3 for spike length (SL). Through marker developme

SUBMITTER: Lv Y 

PROVIDER: S-EPMC11662590 | biostudies-literature | 2024 Dec

REPOSITORIES: biostudies-literature