Atomically resolved imaging of radiation-sensitive metal-organic frameworks via electron ptychography.

ABSTRACT: Electron ptychography, recognized as an ideal technique for low-dose imaging, consistently achieves deep sub-angstrom resolution at electron doses of several thousand electrons per square angstrom (e^-/Ų) or higher. Despite its proven efficacy, the application of electron ptychography at even lower doses-necessary for materials highly sensitive to electron beams-raises questions regarding its feasibility and the attainable resolution under such stringent conditions. Herein, we demonstrate the implementation of near-atomic-resolution ( ~ 2 Å) electron ptychography reconstruction at electron doses as low as ~100 e^-/Ų, for metal-organic frameworks (MOFs), which are known for their extreme sensitivity. The reconstructed images clearly resolve organi

SUBMITTER: Li G 

PROVIDER: S-EPMC11750992 | biostudies-literature | 2025 Jan

REPOSITORIES: biostudies-literature