High-Resolution Distance Dependence Interrogation of Scanning Ion Conductance Microscopic Tip-Enhanced Raman Spectroscopy Enabled by Two-Dimensional Molybdenum Disulfide Substrates.

ABSTRACT: Scanning ion conductance microscopy (SICM) is a powerful surface imaging tool used in the electrolytic environment. Tip-enhanced Raman spectroscopy (TERS) can give more information in addition to the morphology provided by the SICM by utilizing label-free Raman spectroscopy aided by the localized plasmonic enhancement from the metal-coated probes. In this study, the integration of SICM with TERS is demonstrated through employing a silver-coated plasmonic nanopipette. Leveraging a two-dimensional (2D) molybdenum disulfide (MoS₂) as a model system, the SICM-TERS enhancement factor was estimated to be ∼10⁵, supported by finite-difference time-domain (FDTD) simulation. Moreover, the subnanometer distance dependence SICM-TERS study reveals the tensile stress and structural

SUBMITTER: He X 

PROVIDER: S-EPMC11808850 | biostudies-literature | 2024 Oct

REPOSITORIES: biostudies-literature