Probing Out-Of-Plane Charge Transport in Organic Semiconductors Using Conductive Atomic Force Microscopy.

ABSTRACT: High contact resistance remains the primary obstacle that hinders further advancements of organic semiconductors (OSCs) in electronic circuits. While significant effort has been directed toward lowering the energy barrier at OSC/metal contact interfaces, approaches toward reducing another major contributor to overall contact resistance - the bulk resistance - have been limited to minimizing the thickness of OSC films. However, the out-of-plane conductivity of OSCs, a critical aspect of bulk resistance, has largely remained unaddressed. In this study, multi-layered 2D crystalline, solution-processed films of the high-mobility molecular semiconductor 2,9-dioctylnaphtho[2,3-b] naphtha[2',3':4,5]thieno[2,3-d]thiophene (C8-DNTT-C8) are investigated using conductive-probe atomic force microscopy

SUBMITTER: Gicevicius M 

PROVIDER: S-EPMC11837897 | biostudies-literature | 2025 Feb

REPOSITORIES: biostudies-literature