Optical label-free microscopy characterization of dielectric nanoparticles.

ABSTRACT: In order to relate nanoparticle properties to function, fast and detailed particle characterization is needed. The ability to characterize nanoparticle samples using optical microscopy techniques has drastically improved over the past few decades; consequently, there are now numerous microscopy methods available for detailed characterization of particles with nanometric size. However, there is currently no "one size fits all" solution to the problem of nanoparticle characterization. Instead, since the available techniques have different detection limits and deliver related but different quantitative information, the measurement and analysis approaches need to be selected and adapted for the sample at hand. In this tutorial, we review the optical theory of single particle scattering and how

SUBMITTER: Garcia Rodriguez B 

PROVIDER: S-EPMC11904879 | biostudies-literature | 2025 Apr

REPOSITORIES: biostudies-literature