Reliability of the Transmission Line Method and Reproducibility of the Measured Contact Resistance of Organic Thin-Film Transistors.

ABSTRACT: Using the transmission line method (TLM), we extracted the contact resistance of organic thin-film transistors (TFTs) based on five different vacuum-deposited small-molecule semiconductors fabricated on over 500 substrates. In the first part of this report, we illustrate how the reliability of the TLM analysis is affected by the statistical uncertainty that arises from the fitting procedure and by the systematic error that is introduced if the actual channel length of the TFTs deviates from the nominal channel length. In the second part, we show that the contact resistance of organic TFTs varies significantly from one fabrication run to the next (and even across substrates fabricated within the same fabrication run), no matter how much care is taken to keep all controllable fabrication-pro

SUBMITTER: Wollandt T 

PROVIDER: S-EPMC11924322 | biostudies-literature | 2025 Mar

REPOSITORIES: biostudies-literature