4D-STEM Nanoscale Strain Analysis in van der Waals Materials: Advancing beyond Planar Configurations.

ABSTRACT: Achieving nanoscale strain fields mapping in intricate van der Waals (vdW) nanostructures, like twisted flakes and nanorods, presents several challenges due to their complex geometry, small size, and sensitivity limitations. Understanding these strain fields is pivotal as they significantly influence the optoelectronic properties of vdW materials, playing a crucial role in a plethora of applications ranging from nanoelectronics to nanophotonics. Here, a novel approach for achieving a nanoscale-resolved mapping of strain fields across entire micron-sized vdW nanostructures using four-dimensional (4D) scanning transmission electron microscopy (STEM) imaging equipped with an electron microscope pixel array detector (EMPAD) is presented. This technique extends the capabilities of STEM-based st

SUBMITTER: Bolhuis M 

PROVIDER: S-EPMC11935214 | biostudies-literature | 2024 Mar

REPOSITORIES: biostudies-literature