Enhancing Charge-Emitting Shallow Traps in Metal Halide Perovskites by >100 Times by Surface Strain.

ABSTRACT: The low density of deep trapping defects in metal halide perovskites (MHPs) is essential for high-performance optoelectronic devices. Shallow traps in MHPs are speculated to enhance charges recombination lifetime. However, it is unknown about the shallow trap chemical nature and distribution, and impact on solar cell operation. Herein, we report that shallow traps are much richer in MHPs than traditional semiconductors. Their density can be enhanced by >100 times through local surface strain, indicating shallow traps mainly located at the surface. The surface strain is introduced by anchoring two-amine-terminated molecules onto formamidinium cations, and the shallow traps are formed by the band edge downshifting toward defect levels. The high-density shallow traps temporarily hold one type

SUBMITTER: Zhou Y 

PROVIDER: S-EPMC11936513 | biostudies-literature | 2025 Jan

REPOSITORIES: biostudies-literature