Novel insights into nanoscale surface displacement detection in polystyrene thin films using photothermal mirror- and atomic force microscopy-mid-IR spectroscopy.

ABSTRACT: Photothermal spectroscopy techniques operating at single wavelengths in the vis-NIR range have been widely used to measure optical absorption and thermal characteristics of materials owing to their high sensitivity. We introduced photothermal mirror spectroscopy employing a highly tunable mid-IR pump laser (PTM-IR) for the chemical analysis of thin film polystyrene samples on IR transparent calcium fluoride substrates. PTM-IR spectroscopy surpasses conventional PTM spectroscopy as it provides chemical specificity through molecule-specific absorption via the detection of the magnitude of the PTM signal as a function of the excitation wavelength. We compared the obtained spectra with those measured using atomic force microscopy-infrared spectroscopy (AFM-IR), an already well-establish

SUBMITTER: Yilmaz U 

PROVIDER: S-EPMC11938214 | biostudies-literature | 2025 Mar

REPOSITORIES: biostudies-literature